000 00435nam a2200181Ia 4500
008 240220s9999 xx 000 0 und d
020 _a9783030777753
041 _aENG
082 _a621.3815
100 _aJenkins K. A.
245 0 _aRF and time domain techniques for evaluating novel semiconductor transistors
260 _aNew York
260 _bSpringer
260 _c2022
365 _b55
650 _aETC
942 _cEB
999 _c13742
_d13742