| 000 | 00491nam a2200193Ia 4500 | ||
|---|---|---|---|
| 005 | 20250623164715.0 | ||
| 008 | 240220s9999 xx 000 0 und d | ||
| 020 | _a9789400776623 | ||
| 041 | _aENG | ||
| 100 | _a"Jacopo Franco," | ||
| 245 | 0 | _aReliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications | |
| 260 | _aWiesbaden | ||
| 260 | _bSpringer | ||
| 260 | _c2014 | ||
| 365 | _b301.82 | ||
| 650 | _aETC_ELECTRONICS | ||
| 700 | _a"Ben Kaczer," | ||
| 942 | _cEB | ||
| 999 |
_c12146 _d12146 |
||