| 000 | 00469nam a2200181Ia 4500 | ||
|---|---|---|---|
| 008 | 240220s9999 xx 000 0 und d | ||
| 020 | _a9783319023779 | ||
| 041 | _aENG | ||
| 100 | _a"Brandon Noia," | ||
| 245 | 0 | _aDesign-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs | |
| 260 | _aWiesbaden | ||
| 260 | _bSpringer | ||
| 260 | _c2014 | ||
| 365 | _b301.82 | ||
| 650 | _aETC_ELECTRONICS | ||
| 700 | _aKrishnendu Chakrabarty | ||
| 942 | _cEB | ||
| 999 |
_c11963 _d11963 |
||