Bushnell M. L. <br/><br/>
Essentials of electronic testing for digital memory and mixed signal vlsi circuits 

 - 1ST . Ed. 
 -  Springer  2000 
 - 690p. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>ETC
<br/><br/><label>Dewey Class. No.: </label>621.395