"Jacopo Franco," <br/><br/>
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications 

 - Wiesbaden  Springer  2014 
<br/><br/><label>ISBN: </label>9789400776623 
<br/><br/><label>Subjects--Topical Terms: </label><br/>ETC_ELECTRONICS