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Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications

"Jacopo Franco,"

Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications - Wiesbaden Springer 2014

ISBN: 9789400776623

Subjects--Topical Terms:
ETC_ELECTRONICS

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Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications

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